Lazy Pipelines: Enhancing quality in approximate computing

G. Tziantzioulis, A. M. Gok, S. M. Faisal, N. Hardavellas, S. Ogrenci-Memik, S. Parthsarathy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations

Abstract

Approximate computing techniques based on Voltage Over-Scaling (VOS) can provide quadratic improvements in power efficiency. However, voltage scaling is limited by the inherent fault-tolerance of an application, thus preventing VOS schemes from realizing their full potential. To gain further power efficiency a reduction of the error rate experienced in a given voltage level is required. We propose Lazy Pipelines, a micro-architectural technique that utilizes vacant cycles in a VOS functional unit to extend execution and reduce the error rate.

Original languageEnglish (US)
Title of host publicationProceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1381-1386
Number of pages6
ISBN (Electronic)9783981537062
StatePublished - Apr 25 2016
Event19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 - Dresden, Germany
Duration: Mar 14 2016Mar 18 2016

Publication series

NameProceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016

Other

Other19th Design, Automation and Test in Europe Conference and Exhibition, DATE 2016
CountryGermany
CityDresden
Period3/14/163/18/16

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Keywords

  • approximate computing
  • microarchitecture
  • power efficiency

ASJC Scopus subject areas

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

Cite this

Tziantzioulis, G., Gok, A. M., Faisal, S. M., Hardavellas, N., Ogrenci-Memik, S., & Parthsarathy, S. (2016). Lazy Pipelines: Enhancing quality in approximate computing. In Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016 (pp. 1381-1386). [7459524] (Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016). Institute of Electrical and Electronics Engineers Inc..