TY - GEN
T1 - Leakage power-aware clock skew scheduling
T2 - 45th Design Automation Conference, DAC
AU - Ni, Min
AU - Memik, Seda Ogrenci
PY - 2008
Y1 - 2008
N2 - Clock skew scheduling has been traditionally considered as a tool for improving the clock period in a sequential circuit. Timing slack is "stolen" from fast combinational blocks to be used by slower blocks to meet a more stringent clock cycle time. Instead, we can leverage on the borrowed time to achieve leakage power reduction during gate sizing and/or dual Vth assignment. In this paper, we present the first approach to the best of our knowledge for integrating clock skew scheduling, threshold voltage assignment, and gate sizing into one optimization formulation. Over 29 circuits in the ISCAS89 benchmark suite, this integrated approach can reduce leakage power by as much as 55.83% and by 18.79% on average, compared to using combinational circuit based power optimization on each combinational block without considering clock skews. Using a 65nm dual Vth technology library, this corresponds to a 23.87% peak reduction (6.15% on average) in total power at the ambient operating temperature. The average total power reduction further increases to 9.83% if the high temperature library of the same process technology is used.
AB - Clock skew scheduling has been traditionally considered as a tool for improving the clock period in a sequential circuit. Timing slack is "stolen" from fast combinational blocks to be used by slower blocks to meet a more stringent clock cycle time. Instead, we can leverage on the borrowed time to achieve leakage power reduction during gate sizing and/or dual Vth assignment. In this paper, we present the first approach to the best of our knowledge for integrating clock skew scheduling, threshold voltage assignment, and gate sizing into one optimization formulation. Over 29 circuits in the ISCAS89 benchmark suite, this integrated approach can reduce leakage power by as much as 55.83% and by 18.79% on average, compared to using combinational circuit based power optimization on each combinational block without considering clock skews. Using a 65nm dual Vth technology library, this corresponds to a 23.87% peak reduction (6.15% on average) in total power at the ambient operating temperature. The average total power reduction further increases to 9.83% if the high temperature library of the same process technology is used.
KW - Clock skew scheduling
KW - Dual-Vth
KW - Gate sizing
KW - Leakage power optimization
UR - http://www.scopus.com/inward/record.url?scp=51549121627&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51549121627&partnerID=8YFLogxK
U2 - 10.1109/DAC.2008.4555890
DO - 10.1109/DAC.2008.4555890
M3 - Conference contribution
AN - SCOPUS:51549121627
SN - 9781605581156
T3 - Proceedings - Design Automation Conference
SP - 610
EP - 613
BT - Proceedings of the 45th Design Automation Conference, DAC
Y2 - 8 June 2008 through 13 June 2008
ER -