Learning Moore-Penrose based residuals for robust non-blind image deconvolution

Santiago López-Tapia, Javier Mateos*, Rafael Molina, Aggelos K. Katsaggelos

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

This paper proposes a deep learning-based method for image restoration given an inaccurate knowledge of the degradation. We first show how the impulse response of a Wiener filter can approximate the Moore-Penrose pseudo-inverse of the blur convolution operator. The deconvolution problem is then cast as the learning of a residual in the null space of the blur kernel, which, when added to the Wiener restoration, will satisfy the image formation model. This approach is expected to make the network capable of dealing with different blurs since only residuals associated with the Wiener filter have to be learned. Artifacts caused by inaccuracies in the blur estimation and other image formation model inconsistencies are removed by a Dynamic Filter Network. The extensive experiments carried out on several synthetic and real image datasets assert the proposed method's performance and robustness and demonstrate the advantage of the proposed method over existing ones.

Original languageEnglish (US)
Article number104193
JournalDigital Signal Processing: A Review Journal
Volume142
DOIs
StatePublished - Oct 2023

Funding

This work was supported by grants P20_00286 and B-TIC-324-UGR20 funded by Consejería de Universidad, Investigación e Innovación ( Junta de Andalucía ) and by “ ERDF A way of making Europe”. Funding for open access charge: Universidad de Granada / CBUA .

Keywords

  • Analytical methods
  • Convolutional neural network
  • Deep learning
  • Moore-Penrose inverse
  • Robust non-blind image deconvolution

ASJC Scopus subject areas

  • Signal Processing
  • Computer Vision and Pattern Recognition
  • Statistics, Probability and Uncertainty
  • Computational Theory and Mathematics
  • Artificial Intelligence
  • Applied Mathematics
  • Electrical and Electronic Engineering

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