Line-focus acoustic microscopy has been used to measure the phase velocities of surface acoustic waves on bare MgO and bare LaAI03, and on Nb205/MgO and BaTi03/LaAI03 thin-film/substrate configurations. The thin films are polycrystalline materials. The substrates are anisotropic single-crystals. The measured angular variation of the surface acoustic wave velocities has been used to determine the elastic constants of MgO substrate and Nb205 thin-film. It has been assumed that the Nb205 films may be considered as essentially isotropic. The measurements for LaAI03 and BaTi03/LaAI03 show anomalies which are attributed to twinning in the LaAI03 substrate.
|Original language||English (US)|
|Number of pages||5|
|Journal||IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control|
|State||Published - May 1995|
ASJC Scopus subject areas
- Acoustics and Ultrasonics
- Electrical and Electronic Engineering