Abstract
It is experimentally established that one can use linear imaging theory with implied kinematical diffraction theory to understand the high resolution image of an amorphous material of thickness 10-20 nm. It is also established that an equivalent thickness of a crystalline material cannot be understood by these models, but instead requires non-linear imaging theory and dynamical diffraction. It is shown here that an amorphous material is a special case where the non-linear and dynamical diffraction solutions reduce to simpler linear and kinematical forms.
Original language | English (US) |
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Pages (from-to) | 85-87 |
Number of pages | 3 |
Journal | Ultramicroscopy |
Volume | 25 |
Issue number | 1 |
DOIs | |
State | Published - 1988 |
Funding
This work was supported by the NSF on grant number DMR 85-20280.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation