Abstract
In this work we demonstrate the utility of three-dimensional focused ion beam-scanning electron microscopy nanotomography for understanding composite electrode performance and degradation. Phase connectivity, electrochemically active triple-phase boundary density and phase tortuosity are calculated for a series of anodes with varying Ni-YSZ composition. These structural characteristics, achievable only through three-dimensional interrogation, are shown to play a vital role in determining electrode polarization resistance. Additionally, Ni-YSZ samples are experimentally annealed in hydrogen and reconstructed to quantitatively assess degradation as a function of reduced triple-phase boundary density.
Original language | English (US) |
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Pages (from-to) | 67-72 |
Number of pages | 6 |
Journal | Scripta Materialia |
Volume | 65 |
Issue number | 2 |
DOIs | |
State | Published - Jul 2011 |
Funding
The authors gratefully acknowledge the financial support of the National Science Foundation Ceramics program through grant DMR-0907639 . The FIB–SEM (Zeiss) was accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory, a US Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.
Keywords
- Electrodes
- FIB-SEM
- Microstructure
- SOFC
- Tomography
ASJC Scopus subject areas
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys