Local optical spectroscopy of self-assembled quantum dots using a near-field optical fiber probe to induce a localized strain field

H. D. Robinson*, M. G. Müller, B. B. Goldberg, J. L. Merz

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

36 Scopus citations

Abstract

We introduce and demonstrate a novel operating mode in near-field optical microscopy. The tip is used to simultaneously optically probe the sample and induce a highly localized strain in the area under study by pushing the tip into the sample. From knowledge of total tip-sample compression and tip geometry, we estimate the magnitude of stress, and show that localized uniaxial-like stresses in excess of 10 kbar can be achieved. We apply this method to a sample of InAlAs self-assembled quantum dots. A blueshift of quantum dot emission lines consistent with estimates of the strain is observed, as well as a quenching of the photoluminescence with strain.

Original languageEnglish (US)
Pages (from-to)2081-2083
Number of pages3
JournalApplied Physics Letters
Volume72
Issue number17
DOIs
StatePublished - 1998

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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