Abstract
A local thermometry technique based on proximity-coupled superconductor/normal-metal/superconductor devices is discussed. A thermometer is developed which dramatically enhances the ability to measure the local electron temperature Te at low temperatures. The technique is helpful in measuring small temperature gradients across a micron-size sample, hence opening up the possibility of quantitatively measuring the thermal properties of mesoscopic devices.
Original language | English (US) |
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Pages (from-to) | 2190-2192 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 83 |
Issue number | 11 |
DOIs | |
State | Published - Sep 15 2003 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)