Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation

J. Diaz; H. J. Yi; Manijeh Razeghi; G. T. Burnham

doi:10.1063/1.119431

Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation

J. Diaz^*, H. J. Yi, Manijeh Razeghi, G. T. Burnham

^*Corresponding author for this work

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60°C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.

Original language	English (US)
Pages (from-to)	3042-3044
Number of pages	3
Journal	Applied Physics Letters
Volume	71
Issue number	21
DOIs	https://doi.org/10.1063/1.119431
State	Published - Nov 24 1997

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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@article{55c6342fcf83481ca0925dfc9715c0df,

title = "Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation",

abstract = "We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60°C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.",

author = "J. Diaz and Yi, {H. J.} and Manijeh Razeghi and Burnham, {G. T.}",

year = "1997",

month = nov,

day = "24",

doi = "10.1063/1.119431",

language = "English (US)",

volume = "71",

pages = "3042--3044",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

number = "21",

}

TY - JOUR

T1 - Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation

AU - Diaz, J.

AU - Yi, H. J.

AU - Razeghi, Manijeh

AU - Burnham, G. T.

PY - 1997/11/24

Y1 - 1997/11/24

N2 - We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60°C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.

AB - We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60°C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.

UR - http://www.scopus.com/inward/record.url?scp=0000922289&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0000922289&partnerID=8YFLogxK

U2 - 10.1063/1.119431

DO - 10.1063/1.119431

M3 - Article

AN - SCOPUS:0000922289

SN - 0003-6951

VL - 71

SP - 3042

EP - 3044

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 21

ER -

Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation

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