Long-term reliability of Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power high-temperature operation

J. Diaz*, H. J. Yi, Manijeh Razeghi, G. T. Burnham

*Corresponding author for this work

Research output: Contribution to journalArticle

32 Scopus citations

Abstract

We report the long-term reliability measurement on uncoated Al-free InGaAsP/GaAs (λ = 808 nm) lasers at high-power and high-temperature operation. No degradation in laser performance has been observed for over 30 000 h of lifetime testing in any of randomly selected several 100-μm-wide uncoated lasers operated at 60°C with 1 W continuous wave output power. This is the first and the most conclusive evidence ever reported that directly shows the high long-term reliability of uncoated Al-free lasers.

Original languageEnglish (US)
Pages (from-to)3042-3044
Number of pages3
JournalApplied Physics Letters
Volume71
Issue number21
DOIs
StatePublished - Nov 24 1997

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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