Low-temperature optical characterization of single CdS nanowires

L. V. Titova; Thang B. Hoang; H. E. Jackson; L. M. Smith; J. M. Yarrison-Rice; J. L. Lensch; L. J. Lauhon

doi:10.1109/nano.2006.247584

Low-temperature optical characterization of single CdS nanowires

L. V. Titova^*, Thang B. Hoang, H. E. Jackson, L. M. Smith, J. M. Yarrison-Rice, J. L. Lensch, L. J. Lauhon

^*Corresponding author for this work

Materials Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states.

Original language	English (US)
Title of host publication	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	123-125
Number of pages	3
ISBN (Print)	1424400783, 9781424400782
DOIs	https://doi.org/10.1109/nano.2006.247584
State	Published - 2006
Event	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States Duration: Jun 17 2006 → Jun 20 2006

Publication series

Name	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Volume	1

Other

Other	2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Country/Territory	United States
City	Cincinnati, OH
Period	6/17/06 → 6/20/06

Keywords

CdS
Nanowires
Photoluminescence imaging

ASJC Scopus subject areas

Electrical and Electronic Engineering
General Materials Science

Access to Document

10.1109/nano.2006.247584

Cite this

Titova, L. V., Hoang, T. B., Jackson, H. E., Smith, L. M., Yarrison-Rice, J. M., Lensch, J. L., & Lauhon, L. J. (2006). Low-temperature optical characterization of single CdS nanowires. In 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 (pp. 123-125). Article 1717034 (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006; Vol. 1). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/nano.2006.247584

@inproceedings{46064bb36f1f4049974b00acd8b1322d,

title = "Low-temperature optical characterization of single CdS nanowires",

abstract = "We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states.",

keywords = "CdS, Nanowires, Photoluminescence imaging",

author = "Titova, {L. V.} and Hoang, {Thang B.} and Jackson, {H. E.} and Smith, {L. M.} and Yarrison-Rice, {J. M.} and Lensch, {J. L.} and Lauhon, {L. J.}",

year = "2006",

doi = "10.1109/nano.2006.247584",

language = "English (US)",

isbn = "1424400783",

series = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "123--125",

booktitle = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006",

address = "United States",

note = "2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 ; Conference date: 17-06-2006 Through 20-06-2006",

}

Titova, LV, Hoang, TB, Jackson, HE, Smith, LM, Yarrison-Rice, JM, Lensch, JL & Lauhon, LJ 2006, Low-temperature optical characterization of single CdS nanowires. in 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006., 1717034, 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006, vol. 1, Institute of Electrical and Electronics Engineers Inc., pp. 123-125, 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006, Cincinnati, OH, United States, 6/17/06. https://doi.org/10.1109/nano.2006.247584

Low-temperature optical characterization of single CdS nanowires. / Titova, L. V.; Hoang, Thang B.; Jackson, H. E. et al.
2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006. Institute of Electrical and Electronics Engineers Inc., 2006. p. 123-125 1717034 (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006; Vol. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Low-temperature optical characterization of single CdS nanowires

AU - Titova, L. V.

AU - Hoang, Thang B.

AU - Jackson, H. E.

AU - Smith, L. M.

AU - Yarrison-Rice, J. M.

AU - Lensch, J. L.

AU - Lauhon, L. J.

PY - 2006

Y1 - 2006

N2 - We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states.

AB - We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states.

KW - CdS

KW - Nanowires

KW - Photoluminescence imaging

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U2 - 10.1109/nano.2006.247584

DO - 10.1109/nano.2006.247584

M3 - Conference contribution

AN - SCOPUS:42549101770

SN - 1424400783

SN - 9781424400782

T3 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

SP - 123

EP - 125

BT - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006

Y2 - 17 June 2006 through 20 June 2006

ER -

Titova LV, Hoang TB, Jackson HE, Smith LM, Yarrison-Rice JM, Lensch JL et al. Low-temperature optical characterization of single CdS nanowires. In 2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006. Institute of Electrical and Electronics Engineers Inc. 2006. p. 123-125. 1717034. (2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006). doi: 10.1109/nano.2006.247584

Low-temperature optical characterization of single CdS nanowires

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Keywords

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