Low-temperature optical characterization of single CdS nanowires

L. V. Titova*, Thang B. Hoang, H. E. Jackson, L. M. Smith, J. M. Yarrison-Rice, J. L. Lensch, Lincoln James Lauhon

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We use spatially resolved micro-PL imaging at low temperature to study optical properties of two sets of CdS nanowires grown using 20 nm and 50 nm catalysts. We find that low temperature PL of single nanowires is an ideal technique to gauge the quality of a given growth run, and moreover enables the collection of detailed spatial information on single wire electronic states.

Original languageEnglish (US)
Title of host publication2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
Pages123-125
Number of pages3
Volume1
StatePublished - Dec 1 2006
Event2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006 - Cincinnati, OH, United States
Duration: Jun 17 2006Jun 20 2006

Other

Other2006 6th IEEE Conference on Nanotechnology, IEEE-NANO 2006
CountryUnited States
CityCincinnati, OH
Period6/17/066/20/06

Keywords

  • CdS
  • Nanowires
  • Photoluminescence imaging

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Materials Science(all)

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