Low-temperature scanning force microscopy using a tuning fork transducer

Yongho Seo*, Paul Cadden-Zimansky, Venkat Chandrasekhar

*Corresponding author for this work

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

We developed a low-temperature scanning force microscope using a quartz tuning fork operating at 4.2 K. A silicon tip from a commercial cantilever was attached to one prong of the tuning fork. With a metallic coating, a potential could be applied to the tip to sense the charge distribution in a sample while with a magnetically coated tip, magnetic force imaging could be performed. For the coarse approach mechanism, we developed a reliable low-temperature walker with low material cost and simple machining. We obtained Coulomb force images of boron nanowires at room temperature and of magnetic nano-structures at low temperature. With the tuning-fork-based magnetic force microscopy (MFM) probe, low-temperature MFM was performed at 77 K and 4.2 K in a high magnetic field (up to 3 T) by using a superconducting.

Original languageEnglish (US)
Pages (from-to)378-383
Number of pages6
JournalJournal of the Korean Physical Society
Volume50
Issue number2
StatePublished - Feb 1 2007

Keywords

  • Atomic force microscopy
  • Low temperature spm
  • Scanning probe microscopy
  • Tuning fork

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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