Magnetic resistivity measurements in nickel films for CIW and CPW domain geometries

D. S. Snowden*, J. G. Checkelsky, S. S. Harberger, N. P. Stern, J. C. Eckert, P. D. Sparks

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

We report magnetoresistance measurements on Ni films with two stripe domain orientations. Measurements were taken for both current parallel to the domain walls (CIW) and current perpendicular to the domain walls (CPW). We observe a negative magnetoresistance for the field applied perpendicular to the plane. For CIW, we observe an added resistance, ΔRCIW/R(2 T), that vanishes after an applied field removes the ordered domains. The ΔR CPW/R(2 T) is comparable to the ΔR/R(2 T) for the disordered domain structure observed after the field is removed. We find ΔR CPW/ΔRCIW is less than one, which is not consistent with previous work.

Original languageEnglish (US)
Pages (from-to)2242-2244
Number of pages3
JournalIEEE Transactions on Magnetics
Volume40
Issue number4 II
DOIs
StatePublished - Jul 1 2004

Keywords

  • Domain-wall resistance
  • Magnetoresistance
  • Nickel
  • Striped magnetic domains

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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