Abstract
Polycrystalline Fe/Cr multilayer films were grown by sputter deposition. The as-grown films showed a mixture of ferromagnetic (FM) and antiferromagnetic (AF) coupling, with an unusually small magnetoresistance (MR) given the degree of AF coupling observed. Annealing for 1 h at 300°C increases the AF component, and the MR increases accordingly. Annealing for one more hour, however, decreases the AF component again with a reduction of MR. Changes in microstructure observed on annealing suggest that interface roughness and pin holes in the film are key factors in determining the magnitude of the GMR effect.
Original language | English (US) |
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Pages (from-to) | 65-66 |
Number of pages | 2 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 156 |
Issue number | 1-3 |
DOIs | |
State | Published - Jan 1 1996 |
Event | Proceedings of the 1995 2nd International Symposium on Metallic Multilayers, MML - Cambridge, UK Duration: Sep 11 1995 → Sep 14 1995 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics