Magnetoresistance in sputtered Fe/Cr multilayer films

E. M. Ho*, A. K. Petford-Long

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations


Polycrystalline Fe/Cr multilayer films were grown by sputter deposition. The as-grown films showed a mixture of ferromagnetic (FM) and antiferromagnetic (AF) coupling, with an unusually small magnetoresistance (MR) given the degree of AF coupling observed. Annealing for 1 h at 300°C increases the AF component, and the MR increases accordingly. Annealing for one more hour, however, decreases the AF component again with a reduction of MR. Changes in microstructure observed on annealing suggest that interface roughness and pin holes in the film are key factors in determining the magnitude of the GMR effect.

Original languageEnglish (US)
Pages (from-to)65-66
Number of pages2
JournalJournal of Magnetism and Magnetic Materials
Issue number1-3
StatePublished - 1996
EventProceedings of the 1995 2nd International Symposium on Metallic Multilayers, MML - Cambridge, UK
Duration: Sep 11 1995Sep 14 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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