Abstract
Polycrystalline Fe/Cr multilayer films were grown by sputter deposition. The as-grown films showed a mixture of ferromagnetic (FM) and antiferromagnetic (AF) coupling, with an unusually small magnetoresistance (MR) given the degree of AF coupling observed. Annealing for 1 h at 300°C increases the AF component, and the MR increases accordingly. Annealing for one more hour, however, decreases the AF component again with a reduction of MR. Changes in microstructure observed on annealing suggest that interface roughness and pin holes in the film are key factors in determining the magnitude of the GMR effect.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 65-66 |
| Number of pages | 2 |
| Journal | Journal of Magnetism and Magnetic Materials |
| Volume | 156 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - 1996 |
| Event | Proceedings of the 1995 2nd International Symposium on Metallic Multilayers, MML - Cambridge, UK Duration: Sep 11 1995 → Sep 14 1995 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics