Mapping Hot Spots at Heterogeneities of Few-Layer Ti                         3                         C                         2                          MXene Sheets

Poya Yasaei; Qing Tu; Yaobin Xu; Louisiane Verger; Jinsong Wu; Michel W. Barsoum; Gajendra S. Shekhawat; Vinayak P. Dravid

doi:10.1021/acsnano.8b09103

Mapping Hot Spots at Heterogeneities of Few-Layer Ti ₃ C ₂ MXene Sheets

Poya Yasaei, Qing Tu, Yaobin Xu, Louisiane Verger, Jinsong Wu, Michel W. Barsoum, Gajendra S. Shekhawat, Vinayak P. Dravid^*

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

Structural defects and heterogeneities play an enormous role in the formation of localized hot spots in 2D materials used in a wide range of applications from electronics to energy systems. In this report, we employ scanning thermal microscopy (SThM) to spatially map the temperature rise across various defects and heterogeneities of titanium carbide (Ti ₃ C ₂ T _x ; T stands for surface terminations) MXene nanostructures under high electrical bias with sub-50 mK temperature resolution and sub-100 nm spatial resolution. We investigated several Ti ₃ C ₂ T _x flakes having different thicknesses as well as heterogeneous MXene structures incorporating line defects or vertical heterojunctions. High-resolution temperature rise maps allow us to identify localized hot spots and to quantify the nonuniformity of the temperature fields across various morphological features. The results show that the local heating is most severe in vertical junctions of MXene flakes and is highly affected by nonuniform conduction due to the presence of line defects. These results provide a direct insight into the power dissipation of MXene-based devices and the roles of various heterogeneities that are inherent to the material synthesis process. This study provides a guideline for how a better understanding of the structure-property-processing correlations and further optimization of the synthesis routes could improve the lifetime, safety, and operation limits of the MXene-based devices.

Original language	English (US)
Pages (from-to)	3301-3309
Number of pages	9
Journal	ACS nano
Volume	13
Issue number	3
DOIs	https://doi.org/10.1021/acsnano.8b09103
State	Published - Mar 26 2019

Funding

The work made use of the SPID and EPIC facilities of Northwestern University’s NUANCE center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation, and the State of Illinois, through the IIN. This work was supported by the National Science Foundation IDBR-1256188 and partially supported by Air Force Research Laboratory Grant FA8650-15-2-5518. This work also made use of the Pritzker Nanofabrication Facility of the Institute for Molecular Engineering at the University of Chicago, which receives support from SHyNE Resource (NSF ECCS-1542205).

Keywords

2D materials
MXene
defect
heterogeneities
hot-spot identification
scanning thermal microscopy (SThM)
temperature mapping

ASJC Scopus subject areas

General Engineering
General Physics and Astronomy
General Materials Science

Access to Document

10.1021/acsnano.8b09103

Cite this

@article{c58f72b418414e2e817b9bac056f3ccb,

title = "Mapping Hot Spots at Heterogeneities of Few-Layer Ti 3 C 2 MXene Sheets",

abstract = " Structural defects and heterogeneities play an enormous role in the formation of localized hot spots in 2D materials used in a wide range of applications from electronics to energy systems. In this report, we employ scanning thermal microscopy (SThM) to spatially map the temperature rise across various defects and heterogeneities of titanium carbide (Ti 3 C 2 T x ; T stands for surface terminations) MXene nanostructures under high electrical bias with sub-50 mK temperature resolution and sub-100 nm spatial resolution. We investigated several Ti 3 C 2 T x flakes having different thicknesses as well as heterogeneous MXene structures incorporating line defects or vertical heterojunctions. High-resolution temperature rise maps allow us to identify localized hot spots and to quantify the nonuniformity of the temperature fields across various morphological features. The results show that the local heating is most severe in vertical junctions of MXene flakes and is highly affected by nonuniform conduction due to the presence of line defects. These results provide a direct insight into the power dissipation of MXene-based devices and the roles of various heterogeneities that are inherent to the material synthesis process. This study provides a guideline for how a better understanding of the structure-property-processing correlations and further optimization of the synthesis routes could improve the lifetime, safety, and operation limits of the MXene-based devices.",

keywords = "2D materials, MXene, defect, heterogeneities, hot-spot identification, scanning thermal microscopy (SThM), temperature mapping",

author = "Poya Yasaei and Qing Tu and Yaobin Xu and Louisiane Verger and Jinsong Wu and Barsoum, {Michel W.} and Shekhawat, {Gajendra S.} and Dravid, {Vinayak P.}",

note = "Funding Information: The work made use of the SPID and EPIC facilities of Northwestern University{\textquoteright}s NUANCE center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation, and the State of Illinois, through the IIN. This work was supported by the National Science Foundation IDBR-1256188 and partially supported by Air Force Research Laboratory Grant FA8650-15-2-5518. This work also made use of the Pritzker Nanofabrication Facility of the Institute for Molecular Engineering at the University of Chicago, which receives support from SHyNE Resource (NSF ECCS-1542205). Publisher Copyright: {\textcopyright} 2019 American Chemical Society.",

year = "2019",

month = mar,

day = "26",

doi = "10.1021/acsnano.8b09103",

language = "English (US)",

volume = "13",

pages = "3301--3309",

journal = "ACS nano",

issn = "1936-0851",

publisher = "American Chemical Society",

number = "3",

}

TY - JOUR

T1 - Mapping Hot Spots at Heterogeneities of Few-Layer Ti 3 C 2 MXene Sheets

AU - Yasaei, Poya

AU - Tu, Qing

AU - Xu, Yaobin

AU - Verger, Louisiane

AU - Wu, Jinsong

AU - Barsoum, Michel W.

AU - Shekhawat, Gajendra S.

AU - Dravid, Vinayak P.

N1 - Funding Information: The work made use of the SPID and EPIC facilities of Northwestern University’s NUANCE center, which has received support from the Soft and Hybrid Nanotechnology Experimental (SHyNE) resource (NSF ECCS-1542205); the MRSEC program (NSF DMR-1720139) at the Materials Research Center; the International Institute for Nanotechnology (IIN); the Keck Foundation, and the State of Illinois, through the IIN. This work was supported by the National Science Foundation IDBR-1256188 and partially supported by Air Force Research Laboratory Grant FA8650-15-2-5518. This work also made use of the Pritzker Nanofabrication Facility of the Institute for Molecular Engineering at the University of Chicago, which receives support from SHyNE Resource (NSF ECCS-1542205). Publisher Copyright: © 2019 American Chemical Society.

PY - 2019/3/26

Y1 - 2019/3/26

N2 - Structural defects and heterogeneities play an enormous role in the formation of localized hot spots in 2D materials used in a wide range of applications from electronics to energy systems. In this report, we employ scanning thermal microscopy (SThM) to spatially map the temperature rise across various defects and heterogeneities of titanium carbide (Ti 3 C 2 T x ; T stands for surface terminations) MXene nanostructures under high electrical bias with sub-50 mK temperature resolution and sub-100 nm spatial resolution. We investigated several Ti 3 C 2 T x flakes having different thicknesses as well as heterogeneous MXene structures incorporating line defects or vertical heterojunctions. High-resolution temperature rise maps allow us to identify localized hot spots and to quantify the nonuniformity of the temperature fields across various morphological features. The results show that the local heating is most severe in vertical junctions of MXene flakes and is highly affected by nonuniform conduction due to the presence of line defects. These results provide a direct insight into the power dissipation of MXene-based devices and the roles of various heterogeneities that are inherent to the material synthesis process. This study provides a guideline for how a better understanding of the structure-property-processing correlations and further optimization of the synthesis routes could improve the lifetime, safety, and operation limits of the MXene-based devices.

AB - Structural defects and heterogeneities play an enormous role in the formation of localized hot spots in 2D materials used in a wide range of applications from electronics to energy systems. In this report, we employ scanning thermal microscopy (SThM) to spatially map the temperature rise across various defects and heterogeneities of titanium carbide (Ti 3 C 2 T x ; T stands for surface terminations) MXene nanostructures under high electrical bias with sub-50 mK temperature resolution and sub-100 nm spatial resolution. We investigated several Ti 3 C 2 T x flakes having different thicknesses as well as heterogeneous MXene structures incorporating line defects or vertical heterojunctions. High-resolution temperature rise maps allow us to identify localized hot spots and to quantify the nonuniformity of the temperature fields across various morphological features. The results show that the local heating is most severe in vertical junctions of MXene flakes and is highly affected by nonuniform conduction due to the presence of line defects. These results provide a direct insight into the power dissipation of MXene-based devices and the roles of various heterogeneities that are inherent to the material synthesis process. This study provides a guideline for how a better understanding of the structure-property-processing correlations and further optimization of the synthesis routes could improve the lifetime, safety, and operation limits of the MXene-based devices.

KW - 2D materials

KW - MXene

KW - defect

KW - heterogeneities

KW - hot-spot identification

KW - scanning thermal microscopy (SThM)

KW - temperature mapping

UR - http://www.scopus.com/inward/record.url?scp=85062449528&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85062449528&partnerID=8YFLogxK

U2 - 10.1021/acsnano.8b09103

DO - 10.1021/acsnano.8b09103

M3 - Article

C2 - 30811181

AN - SCOPUS:85062449528

SN - 1936-0851

VL - 13

SP - 3301

EP - 3309

JO - ACS nano

JF - ACS nano

IS - 3

ER -