Materials integrity in microsystems: A framework for a petascale predictive-science-based multiscale modeling and simulation system

Albert C. To, Wing Kam Liu, Gregory B. Olson, Ted Belytschko, Wei Chen, Mark S. Shephard, Yip Wah Chung, Roger Ghanem, Peter W. Voorhees, David N. Seidman, Chris Wolverton, J. S. Chen, Brian Moran, Arthur J. Freeman, Rong Tian, Xiaojuan Luo, Eric Lautenschlager, A. Dorian Challoner