Materials integrity in microsystems: A framework for a petascale predictive-science-based multiscale modeling and simulation system

Albert C. To, Wing K Liu, Gregory B Olson, Ted Belytschko, Wei Chen, Mark S. Shephard, Yip-Wah Chung, Roger Ghanem, Peter W Voorhees, David N Seidman, Christopher M Wolverton, J. S. Chen, Brian Moran, Arthur J Freeman, Rong Tian, Xiaojuan Luo, Eric Lautenschlager, A. Dorian Challoner

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

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Mathematics

Engineering & Materials Science