TY - GEN
T1 - Measurement integration under inconsistency for robust tracking
AU - Hua, Gang
AU - Wu, Ying
PY - 2006
Y1 - 2006
N2 - The solutions to many vision problems involve integrating measurements from multiple sources. Most existing methods rely on a hidden assumption, i.e., these measurements are consistent. In reality, unfortunately, this may not hold. The fact that naively fusing inconsistent measurements amounts to failing these methods indicates that this is not a trivial problem. This paper presents a novel approach to handling it. A new theorem is proven that gives two algebraic criteria to examine the consistency and inconsistency. In addition, a more general criterion is presented. Based on the theoretical analysis, a new information integration method is proposed and leads to encouraging results when applied to the task of visual tracking.
AB - The solutions to many vision problems involve integrating measurements from multiple sources. Most existing methods rely on a hidden assumption, i.e., these measurements are consistent. In reality, unfortunately, this may not hold. The fact that naively fusing inconsistent measurements amounts to failing these methods indicates that this is not a trivial problem. This paper presents a novel approach to handling it. A new theorem is proven that gives two algebraic criteria to examine the consistency and inconsistency. In addition, a more general criterion is presented. Based on the theoretical analysis, a new information integration method is proposed and leads to encouraging results when applied to the task of visual tracking.
UR - http://www.scopus.com/inward/record.url?scp=33845596936&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33845596936&partnerID=8YFLogxK
U2 - 10.1109/CVPR.2006.181
DO - 10.1109/CVPR.2006.181
M3 - Conference contribution
AN - SCOPUS:33845596936
SN - 0769525970
SN - 9780769525976
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 650
EP - 657
BT - Proceedings - 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2006
T2 - 2006 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, CVPR 2006
Y2 - 17 June 2006 through 22 June 2006
ER -