Measurement of gold surface self-diffusion by scanning tunneling microscopy

Tzer Shen Lin*, Yip Wah Chung

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Scopus citations

Abstract

Measurement of gold surface self-diffusion by the method of surface profile decay, using a scanning tunneling microscope (STM) have been done on a polycrystalline gold film deposited on a glass substrate. The peak-to-peak surface roughness was measured as a function of annealing time after annealing at 170 °C with a special pan-cake furnace in the STM. The gold surface diffusion coefficient at 170 °C can then be extracted from these measurements.

Original languageEnglish (US)
Pages (from-to)709-712
Number of pages4
JournalSuperlattices and Microstructures
Volume4
Issue number6
DOIs
StatePublished - 1988

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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