Measurement of gold surface self-diffusion by scanning tunneling microscopy

Tzer Shen Lin; Yip Wah Chung

doi:10.1016/0749-6036(88)90200-5

Measurement of gold surface self-diffusion by scanning tunneling microscopy

Tzer Shen Lin^*, Yip Wah Chung

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

Measurement of gold surface self-diffusion by the method of surface profile decay, using a scanning tunneling microscope (STM) have been done on a polycrystalline gold film deposited on a glass substrate. The peak-to-peak surface roughness was measured as a function of annealing time after annealing at 170 °C with a special pan-cake furnace in the STM. The gold surface diffusion coefficient at 170 °C can then be extracted from these measurements.

Original language	English (US)
Pages (from-to)	709-712
Number of pages	4
Journal	Superlattices and Microstructures
Volume	4
Issue number	6
DOIs	https://doi.org/10.1016/0749-6036(88)90200-5
State	Published - 1988

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1016/0749-6036(88)90200-5

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title = "Measurement of gold surface self-diffusion by scanning tunneling microscopy",

abstract = "Measurement of gold surface self-diffusion by the method of surface profile decay, using a scanning tunneling microscope (STM) have been done on a polycrystalline gold film deposited on a glass substrate. The peak-to-peak surface roughness was measured as a function of annealing time after annealing at 170 °C with a special pan-cake furnace in the STM. The gold surface diffusion coefficient at 170 °C can then be extracted from these measurements.",

author = "Lin, {Tzer Shen} and Chung, {Yip Wah}",

year = "1988",

doi = "10.1016/0749-6036(88)90200-5",

language = "English (US)",

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T1 - Measurement of gold surface self-diffusion by scanning tunneling microscopy

AU - Lin, Tzer Shen

AU - Chung, Yip Wah

PY - 1988

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N2 - Measurement of gold surface self-diffusion by the method of surface profile decay, using a scanning tunneling microscope (STM) have been done on a polycrystalline gold film deposited on a glass substrate. The peak-to-peak surface roughness was measured as a function of annealing time after annealing at 170 °C with a special pan-cake furnace in the STM. The gold surface diffusion coefficient at 170 °C can then be extracted from these measurements.

AB - Measurement of gold surface self-diffusion by the method of surface profile decay, using a scanning tunneling microscope (STM) have been done on a polycrystalline gold film deposited on a glass substrate. The peak-to-peak surface roughness was measured as a function of annealing time after annealing at 170 °C with a special pan-cake furnace in the STM. The gold surface diffusion coefficient at 170 °C can then be extracted from these measurements.

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U2 - 10.1016/0749-6036(88)90200-5

DO - 10.1016/0749-6036(88)90200-5

M3 - Article

AN - SCOPUS:0024132833

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EP - 712

JO - Superlattices and Microstructures

JF - Superlattices and Microstructures

IS - 6

ER -

Measurement of gold surface self-diffusion by scanning tunneling microscopy

Abstract

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