Measurement of Q degradation due to PMD using importance sampling

L. S. Yan*, M. C. Hauer, P. Ebrahimi, Y. Wang, A. E. Willner, Y. Q. Shi, X. Steve Yao, W. L. Kath

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

Original languageEnglish (US)
Pages (from-to)1521-1523
Number of pages3
JournalOSA Trends in Optics and Photonics Series
Volume88
StatePublished - Jan 1 2003
EventConference on Lasers and Electro-Optics (CLEO); Postconference Digest - Baltimore, MD, United States
Duration: Jun 1 2003Jun 6 2003

ASJC Scopus subject areas

  • Engineering(all)

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