Measurement of Q degradation due to PMD using importance sampling

L. S. Yan; M. C. Hauer; P. Ebrahimi; Y. Wang; A. E. Willner; Y. Q. Shi; X. Steve Yao; W. L. Kath

Measurement of Q degradation due to PMD using importance sampling

L. S. Yan^*, M. C. Hauer, P. Ebrahimi, Y. Wang, A. E. Willner, Y. Q. Shi, X. Steve Yao, W. L. Kath

^*Corresponding author for this work

Engineering Sciences and Applied Mathematics

Research output: Contribution to journal › Conference article › peer-review

Abstract

We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10^-17 with only 1800 samples. Without IS, >10¹⁷ samples are required to examine such low-probability events.

Original language	English (US)
Pages (from-to)	1521-1523
Number of pages	3
Journal	OSA Trends in Optics and Photonics Series
Volume	88
State	Published - 2003
Event	Conference on Lasers and Electro-Optics (CLEO); Postconference Digest - Baltimore, MD, United States Duration: Jun 1 2003 → Jun 6 2003

ASJC Scopus subject areas

Engineering(all)

Cite this

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title = "Measurement of Q degradation due to PMD using importance sampling",

abstract = "We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.",

author = "Yan, {L. S.} and Hauer, {M. C.} and P. Ebrahimi and Y. Wang and Willner, {A. E.} and Shi, {Y. Q.} and Yao, {X. Steve} and Kath, {W. L.}",

year = "2003",

language = "English (US)",

volume = "88",

pages = "1521--1523",

journal = "OSA Trends in Optics and Photonics Series",

issn = "1094-5695",

note = "Conference on Lasers and Electro-Optics (CLEO); Postconference Digest ; Conference date: 01-06-2003 Through 06-06-2003",

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TY - JOUR

T1 - Measurement of Q degradation due to PMD using importance sampling

AU - Yan, L. S.

AU - Hauer, M. C.

AU - Ebrahimi, P.

AU - Wang, Y.

AU - Willner, A. E.

AU - Shi, Y. Q.

AU - Yao, X. Steve

AU - Kath, W. L.

PY - 2003

Y1 - 2003

N2 - We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

AB - We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

UR - http://www.scopus.com/inward/record.url?scp=8744269704&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=8744269704&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:8744269704

SN - 1094-5695

VL - 88

SP - 1521

EP - 1523

JO - OSA Trends in Optics and Photonics Series

JF - OSA Trends in Optics and Photonics Series

T2 - Conference on Lasers and Electro-Optics (CLEO); Postconference Digest

Y2 - 1 June 2003 through 6 June 2003

ER -

Measurement of Q degradation due to PMD using importance sampling

Abstract

ASJC Scopus subject areas

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