Measurement of Q Degradation due to PMD Using Importance Sampling

L. S. Yan; M. C. Hauer; P. Ebrahimi; Y. Wang; A. E. Willner; Y. Q. Shi; X. Steve Yao; W. L. Kath

Measurement of Q Degradation due to PMD Using Importance Sampling

L. S. Yan^*, M. C. Hauer, P. Ebrahimi, Y. Wang, A. E. Willner, Y. Q. Shi, X. Steve Yao, W. L. Kath

^*Corresponding author for this work

Engineering Sciences and Applied Mathematics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10^-17 with only 1800 samples. Without IS, >10¹⁷ samples are required to examine such low-probability events.

Original language	English (US)
Title of host publication	Conference on Lasers and Electro-Optics, CLEO 2003
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	1557527334
State	Published - 2003
Event	Conference on Lasers and Electro-Optics, CLEO 2003 - Baltimore, United States Duration: Jun 1 2003 → Jun 6 2003

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Conference on Lasers and Electro-Optics, CLEO 2003
Country/Territory	United States
City	Baltimore
Period	6/1/03 → 6/6/03

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Cite this

@inproceedings{ce33ade630f0434f85112762845c2b8d,

title = "Measurement of Q Degradation due to PMD Using Importance Sampling",

abstract = "We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.",

author = "Yan, {L. S.} and Hauer, {M. C.} and P. Ebrahimi and Y. Wang and Willner, {A. E.} and Shi, {Y. Q.} and Yao, {X. Steve} and Kath, {W. L.}",

note = "Publisher Copyright: {\textcopyright} 2003 OSA/CLEO 2003.; Conference on Lasers and Electro-Optics, CLEO 2003 ; Conference date: 01-06-2003 Through 06-06-2003",

year = "2003",

language = "English (US)",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Conference on Lasers and Electro-Optics, CLEO 2003",

}

Yan, LS, Hauer, MC, Ebrahimi, P, Wang, Y, Willner, AE, Shi, YQ, Yao, XS & Kath, WL 2003, Measurement of Q Degradation due to PMD Using Importance Sampling. in Conference on Lasers and Electro-Optics, CLEO 2003., CThJ6, Optics InfoBase Conference Papers, Optica Publishing Group (formerly OSA), Conference on Lasers and Electro-Optics, CLEO 2003, Baltimore, United States, 6/1/03.

TY - GEN

T1 - Measurement of Q Degradation due to PMD Using Importance Sampling

AU - Yan, L. S.

AU - Hauer, M. C.

AU - Ebrahimi, P.

AU - Wang, Y.

AU - Willner, A. E.

AU - Shi, Y. Q.

AU - Yao, X. Steve

AU - Kath, W. L.

PY - 2003

Y1 - 2003

N2 - We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

AB - We use multiple importance-sampling (IS) to measure the Q degradation due to PMD emulated by three programmable DGD elements with uniform polarization-coupling between sections. The measured Q-penalty probability distribution extends to <10-17 with only 1800 samples. Without IS, >1017 samples are required to examine such low-probability events.

UR - http://www.scopus.com/inward/record.url?scp=85136318289&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85136318289&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:85136318289

T3 - Optics InfoBase Conference Papers

BT - Conference on Lasers and Electro-Optics, CLEO 2003

PB - Optica Publishing Group (formerly OSA)

T2 - Conference on Lasers and Electro-Optics, CLEO 2003

Y2 - 1 June 2003 through 6 June 2003

ER -

Measurement of Q Degradation due to PMD Using Importance Sampling

Abstract

Publication series

Conference

ASJC Scopus subject areas

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