Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling

L. S. Yan*, M. C. Hauer, P. Ebrahimi, Y. Wang, Y. Q. Shi, X. Steve Yao, A. E. Willner, W. L. Kath

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Multiple importance-sampling (IS) was used to measure the Q degradation due to the polarization mode dispersion generated by three programmable differential group delay (DGD) elements with uniform polarization coupling between sections. An emulator was placed in a 10 Gbit/s transmission system, and the impact of polarization mode dispersion (PMD) on the statistics of the system Q for both average and extremely rare PMD events was studied. The measured Q-penalty probability distribution extended to < 10-17 with only 1800 experimental samples.

Original languageEnglish (US)
Pages (from-to)974-975
Number of pages2
JournalElectronics Letters
Volume39
Issue number13
DOIs
StatePublished - Jun 25 2003

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Measurement of Q degradation due to polarisation mode dispersion using multiple importance sampling'. Together they form a unique fingerprint.

Cite this