Measurement of refractive index of AlxGa1-xAs by a grating coupling technique

R. G. Kaufman*, A. L. Moretti, D. J. Vezzetti, F. A. Chambers, K. A. Stair, G. Hulse

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We have determined the refractive index of AlxGa1-xAs for wavelengths from 0.79 to 1.15 microns with 0<x<0.40 by measuring and analyzing the coupling of light, via a holographic grating, into the guided modes of MBE grown slab waveguides with cores and claddings of different x.

Original languageEnglish (US)
Title of host publicationLEOS 88 Lasers Electro Optics Soc Annu Meet
Pages67-69
Number of pages3
StatePublished - Dec 1 1988
EventLEOS '88 - Lasers and Electro-Optics Society Annual Meeting - Santa Clara, CA, USA
Duration: Nov 2 1988Nov 4 1988

Other

OtherLEOS '88 - Lasers and Electro-Optics Society Annual Meeting
CitySanta Clara, CA, USA
Period11/2/8811/4/88

ASJC Scopus subject areas

  • Engineering(all)

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