Measurement of the electrical resistivity and Hall coefficient at high temperatures

Kasper A. Borup, Eric S. Toberer, Leslie D. Zoltan, George Nakatsukasa, Michael Errico, Jean Pierre Fleurial, Bo B. Iversen, G. Jeffrey Snyder*

*Corresponding author for this work

Research output: Contribution to journalArticle

151 Scopus citations

Abstract

The implementation of the van der Pauw (VDP) technique for combined high temperature measurement of the electrical resistivity and Hall coefficient is described. The VDP method is convenient for use since it accepts sample geometries compatible with other measurements. The technique is simple to use and can be used with samples showing a broad range of shapes and physical properties, from near insulators to metals. Three instruments utilizing the VDP method for measurement of heavily doped semiconductors, such as thermoelectrics, are discussed.

Original languageEnglish (US)
Article number123902
JournalReview of Scientific Instruments
Volume83
Issue number12
DOIs
StatePublished - Dec 1 2012

ASJC Scopus subject areas

  • Instrumentation

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    Borup, K. A., Toberer, E. S., Zoltan, L. D., Nakatsukasa, G., Errico, M., Fleurial, J. P., Iversen, B. B., & Snyder, G. J. (2012). Measurement of the electrical resistivity and Hall coefficient at high temperatures. Review of Scientific Instruments, 83(12), [123902]. https://doi.org/10.1063/1.4770124