Measurement of the spatial backscattering impulse-response at short length scales with polarized enhanced backscattering

Andrew J. Radosevich*, Nikhil N. Mutyal, Vladimir Turzhitsky, Jeremy D. Rogers, Ji Yi, Allen Taflove, Vadim Backman

*Corresponding author for this work

Research output: Contribution to journalArticle

14 Scopus citations

Abstract

In this Letter, we describe an easy to implement technique to measure the spatial backscattering impulse-response at length scales shorter than a transport mean free path with resolution of better than 10 μm using the enhanced backscattering phenomenon. This technique enables spectroscopic measurements throughout the visible range and sensitivity to all polarization channels. Through a combination of Monte Carlo simulations and experimental measurements of latex microspheres, we explore the various sensitivities of our technique to both intrinsic sample properties and extrinsic instrumental properties. We conclude by demonstrating the extraordinary sensitivity of our technique to the shape of the scattering phase function, including higher order shape parameters than the anisotropy factor (or first moment).

Original languageEnglish (US)
Pages (from-to)4737-4739
Number of pages3
JournalOptics Letters
Volume36
Issue number24
DOIs
StatePublished - Dec 15 2011

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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