Measurement of thermal stress in Pd2Si film on Si(111) by absorption edge contour mapping

Haydn Chen*, G. E. White, S. R. Stock

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Measurement of thermal stress in Pd2Si film on Si(111) by absorption edge contour mapping'. Together they form a unique fingerprint.

Keyphrases

Engineering

Earth and Planetary Sciences

Material Science