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Measuring carrier density in parallel conduction layers of quantum Hall systems
M. Grayson
*
, F. Fischer
*
Corresponding author for this work
Electrical and Computer Engineering
Research output
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Contribution to journal
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Article
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peer-review
16
Scopus citations
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Keyphrases
Carrier Density
100%
Parallel Conduction
100%
Conduction Layer
100%
Quantum Hall System
100%
Modulation-doped
66%
Doped Layers
66%
Parallel Layers
66%
Magnetic Field
33%
Heterostructure
33%
Quantum Well
33%
Conductivity Tensor
33%
Hall Measurement
33%
Heterojunction
33%
Charge Density
33%
Simple Formula
33%
Conducting Layer
33%
Quantum Hall Regime
33%
Freeze-out
33%
Engineering
Carrier Concentration
100%
Data Show
33%
Heterostructures
33%
Resistive
33%
Doped Layer
33%
Illustrates
33%
Quantum Well
33%
Magnetic Field
33%
Heterojunctions
33%
Charge Density
33%
Resistivity Tensor
33%