Abstract
Atom probe tomography (APT) is used to investigate grain-boundary segregation of W solute atoms in nanocrystalline Ni. For the heat-treated specimens used here, the grain structure can be observed in the APT data, enabling direct composition analyses across individual grain boundaries. These direct measurements are used to validate methods proposed in earlier work, which determine the average segregation state in nanocrystalline materials through statistical analysis of the solute distribution, without knowledge of the boundary positions. Good agreement is demonstrated between the two experimental techniques.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 581-587 |
| Number of pages | 7 |
| Journal | Philosophical Magazine Letters |
| Volume | 87 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 2007 |
Funding
This work was supported by the US Army Research Office under contract DAAD19-03-1-0235. Research at the Oak Ridge National Laboratory SHaRE User Facility was sponsored by the Office of Basic Energy Sciences, Division of Scientific User Facilities, US Department of Energy, under contract DE-AC05-00OR22725 with UT-Battelle, LLC.
ASJC Scopus subject areas
- Condensed Matter Physics