Media Testing

Kevin Curtis; Lisa Dhar; Alan Hoskins; Mark Ayres; Edeline Fotheringham

doi:10.1002/9780470666531.ch8

Media Testing

Kevin Curtis^*, Lisa Dhar, Alan Hoskins, Mark Ayres, Edeline Fotheringham

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Chapter

1 Scopus citations

Original language	English (US)
Title of host publication	Holographic Data Storage
Subtitle of host publication	From Theory to Practical Systems
Publisher	John Wiley and Sons
Pages	151-183
Number of pages	33
ISBN (Print)	9780470749623
DOIs	https://doi.org/10.1002/9780470666531.ch8
State	Published - Jun 30 2010
Externally published	Yes

Keywords

Accelerated lifetime testing
Bulk index measurements - bulk index and bulk index changes with post-cure, measured before using plane wave tester
Coefficient of thermal expansion (CTE) of material
Defect detection, for volume production leverages current CD/DVD inspection equipment
Large interferometer, for studying large scale index changes and optical disk quality
Media testing
Plane wave holographic material tester (HMT)
Plane wave material testing
Plane wave tester set-up
Spectrophotometers and spectrometers - in media and material development

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1002/9780470666531.ch8

Cite this

@inbook{4ea062d88f86400b9056f09e392eec04,

title = "Media Testing",

keywords = "Accelerated lifetime testing, Bulk index measurements - bulk index and bulk index changes with post-cure, measured before using plane wave tester, Coefficient of thermal expansion (CTE) of material, Defect detection, for volume production leverages current CD/DVD inspection equipment, Large interferometer, for studying large scale index changes and optical disk quality, Media testing, Plane wave holographic material tester (HMT), Plane wave material testing, Plane wave tester set-up, Spectrophotometers and spectrometers - in media and material development",

author = "Kevin Curtis and Lisa Dhar and Alan Hoskins and Mark Ayres and Edeline Fotheringham",

year = "2010",

month = jun,

day = "30",

doi = "10.1002/9780470666531.ch8",

language = "English (US)",

isbn = "9780470749623",

pages = "151--183",

booktitle = "Holographic Data Storage",

publisher = "John Wiley and Sons",

}

TY - CHAP

T1 - Media Testing

AU - Curtis, Kevin

AU - Dhar, Lisa

AU - Hoskins, Alan

AU - Ayres, Mark

AU - Fotheringham, Edeline

PY - 2010/6/30

Y1 - 2010/6/30

KW - Accelerated lifetime testing

KW - Bulk index measurements - bulk index and bulk index changes with post-cure, measured before using plane wave tester

KW - Coefficient of thermal expansion (CTE) of material

KW - Defect detection, for volume production leverages current CD/DVD inspection equipment

KW - Large interferometer, for studying large scale index changes and optical disk quality

KW - Media testing

KW - Plane wave holographic material tester (HMT)

KW - Plane wave material testing

KW - Plane wave tester set-up

KW - Spectrophotometers and spectrometers - in media and material development

UR - http://www.scopus.com/inward/record.url?scp=84886218813&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84886218813&partnerID=8YFLogxK

U2 - 10.1002/9780470666531.ch8

DO - 10.1002/9780470666531.ch8

M3 - Chapter

AN - SCOPUS:84886218813

SN - 9780470749623

SP - 151

EP - 183

BT - Holographic Data Storage

PB - John Wiley and Sons

ER -

Media Testing

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this