Methodological aspects of the highenergy synchrotron X-ray diffraction technique for internal stress evaluation

Alexander Wanner*, David C. Dunand

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

The availability of high-energy X-rays from 3rd-generation synchrotron sources offers new approaches to study internal stresses in the bulk of crystalline materials. A method with a wide application potential is the transmission technique introduced by Daymond and Withers, which however has so far been limited to fine-grained materials. In the present work, the reasons for the currently existing limitations are discussed and a viable strategy to extend the technique to samples with coarser grain sizes is proposed.

Original languageEnglish (US)
Pages (from-to)495-501
Number of pages7
JournalJournal of Neutron Research
Volume9
Issue number2-4
DOIs
StatePublished - Jan 1 2001

Keywords

  • Grain size
  • Internal stress measurement
  • Monochromatic high-energy X-rays
  • Probe volume
  • X-ray diffraction

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Nuclear Energy and Engineering

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