Abstract
A new high-pressure energy-dispersive x-ray diffraction apparatus is described. Two major features distinguish this system from previous ones: the ability to collect diffraction data from small sample areas subjected to pressures over 1 Mbar and to scan across the sample. This system also has the ability to calibrate the diffraction angle without making any assumptions about the lattice spacings of the sample.
Original language | English (US) |
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Pages (from-to) | 2560-2563 |
Number of pages | 4 |
Journal | Review of Scientific Instruments |
Volume | 57 |
Issue number | 10 |
DOIs | |
State | Published - Dec 1 1986 |
ASJC Scopus subject areas
- Instrumentation