Microstructural study of top and bottom tunnel junctions

X. Portier; A. K. Petford-Long; J. H. Nickel; T. C. Anthony; J. A. Brug

Microstructural study of top and bottom tunnel junctions

X. Portier^*, A. K. Petford-Long, J. H. Nickel, T. C. Anthony, J. A. Brug

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.

Original language	English (US)
Pages (from-to)	BR-02
Journal	Digests of the Intermag Conference
State	Published - 1999
Event	Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea Duration: May 18 1999 → May 21 1999

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

@article{998558b811c94daa94817d2afba84009,

title = "Microstructural study of top and bottom tunnel junctions",

abstract = "This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.",

author = "X. Portier and Petford-Long, {A. K.} and Nickel, {J. H.} and Anthony, {T. C.} and Brug, {J. A.}",

year = "1999",

language = "English (US)",

pages = "BR--02",

journal = "Digests of the Intermag Conference",

issn = "0074-6843",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' ; Conference date: 18-05-1999 Through 21-05-1999",

}

TY - JOUR

T1 - Microstructural study of top and bottom tunnel junctions

AU - Portier, X.

AU - Petford-Long, A. K.

AU - Nickel, J. H.

AU - Anthony, T. C.

AU - Brug, J. A.

PY - 1999

Y1 - 1999

N2 - This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.

AB - This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.

UR - http://www.scopus.com/inward/record.url?scp=0033301102&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033301102&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0033301102

SN - 0074-6843

SP - BR-02

JO - Digests of the Intermag Conference

JF - Digests of the Intermag Conference

T2 - Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99'

Y2 - 18 May 1999 through 21 May 1999

ER -

Microstructural study of top and bottom tunnel junctions

Abstract

ASJC Scopus subject areas

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