Microstructural study of top and bottom tunnel junctions

X. Portier*, A. K. Petford-Long, J. H. Nickel, T. C. Anthony, J. A. Brug

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations

Abstract

This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.

Original languageEnglish (US)
JournalDigests of the Intermag Conference
StatePublished - Dec 1 1999
EventProceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea
Duration: May 18 1999May 21 1999

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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