This report discusses the high resolution electron microscopy (HREM) observations of top and bottom tunnel junctions. Based on these observations, the microstructural properties of the junctions are correlated to their tunnel magnetoresistance effect.
|Original language||English (US)|
|Journal||Digests of the Intermag Conference|
|State||Published - Dec 1 1999|
|Event||Proceedings of the 1999 IEEE International Magnetics Conference 'Digest of Intermag 99' - Kyongju, South Korea|
Duration: May 18 1999 → May 21 1999
ASJC Scopus subject areas
- Electrical and Electronic Engineering