Microstructure-electrical property relationships in cement-based materials

R. A. Olson*, G. M. Moss, B. J. Christensen, J. D. Shane, R. T. Coverdale, E. J. Garboczi, H. M. Jennings, Thomas O Mason

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

A recent progress on the application of impedance spectroscopy (IS) to the study of microstructure and transport in cement-based materials has been reported. With the IS spectrum, bulk resistance could be determined. The high values of the relative dielectric constant result of the microstructure inducing dielectric amplification. The role of large capillary pores in the dielectric amplification in young pastes are confirmed by solvent exchange experiments coupled with digital-image-based computer modeling. When the conductivities (εr) and relative dielectric constants (εr) of ordinary portland cement (OPC) pastes were monitored during cooling and solvent exchange with isopropanol and methanol, dramatic decreases in and as well as a secondary dielectric amplification were observed. By comparing the dielectric behavior of methanol-exchanged OPC pastes to isopropanol-exchanged OPC pastes, additional insight into the variable nature of the C-S-H microstructure was achieved.

Original languageEnglish (US)
Pages (from-to)255-264
Number of pages10
JournalMaterials Research Society Symposium - Proceedings
Volume370
StatePublished - Jan 1 1995

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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