Abstract
Gd/W multilayer films (MLF) have been grown by DC magnetron sputter deposition, and the variation in structure with layer thickness has been determined using high-resolution electron microscopy. The technique has shown some evidence for a thin interfacial region and strong [0002] texture along the film normal for Gd. The cubic GdH2 is sometimes observed, with (111) planes (equivalent to Gd (0002) in the film plane. The relationship between structure and magnetic anisotropy is briefly discussed.
Original language | English (US) |
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Pages (from-to) | 323-330 |
Number of pages | 8 |
Journal | Ultramicroscopy |
Volume | 47 |
Issue number | 4 |
DOIs | |
State | Published - Dec 1992 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation