Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits

Dylan Renaud; Daniel Assumpcao; Chang Jin; David Barton; Jeffrey Holzgrafe; Keith Powell; Matthew Yeh; Amirhassan Shams-Ansari; Marko Loncar

Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits

Dylan Renaud, Daniel Assumpcao, Chang Jin, David Barton, Jeffrey Holzgrafe, Keith Powell, Matthew Yeh, Amirhassan Shams-Ansari, Marko Loncar

Materials Science and Engineering

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

We report on the controlled generation and annihilation of defects in photonic platforms using low-energy electron beams. We show how these defects impact propagation losses and EO-stability in LNOI, and how they can be rectified.

Original language	English (US)
State	Published - 2024
Event	CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics - Charlotte, United States Duration: May 5 2024 → May 10 2024

Conference

Conference	CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics
Country/Territory	United States
City	Charlotte
Period	5/5/24 → 5/10/24

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
General Computer Science
Space and Planetary Science
Control and Systems Engineering
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Instrumentation

Cite this

Renaud, D., Assumpcao, D., Jin, C., Barton, D., Holzgrafe, J., Powell, K., Yeh, M., Shams-Ansari, A., & Loncar, M. (2024). Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits. Paper presented at CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics, Charlotte, United States.

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title = "Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits",

abstract = "We report on the controlled generation and annihilation of defects in photonic platforms using low-energy electron beams. We show how these defects impact propagation losses and EO-stability in LNOI, and how they can be rectified.",

author = "Dylan Renaud and Daniel Assumpcao and Chang Jin and David Barton and Jeffrey Holzgrafe and Keith Powell and Matthew Yeh and Amirhassan Shams-Ansari and Marko Loncar",

note = "Publisher Copyright: {\textcopyright} Optica Publishing Group 2024; CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics ; Conference date: 05-05-2024 Through 10-05-2024",

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Renaud, D, Assumpcao, D, Jin, C, Barton, D, Holzgrafe, J, Powell, K, Yeh, M, Shams-Ansari, A & Loncar, M 2024, 'Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits', Paper presented at CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics, Charlotte, United States, 5/5/24 - 5/10/24.

Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits. / Renaud, Dylan; Assumpcao, Daniel; Jin, Chang et al.
2024. Paper presented at CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics, Charlotte, United States.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits

AU - Renaud, Dylan

AU - Assumpcao, Daniel

AU - Jin, Chang

AU - Barton, David

AU - Holzgrafe, Jeffrey

AU - Powell, Keith

AU - Yeh, Matthew

AU - Shams-Ansari, Amirhassan

AU - Loncar, Marko

PY - 2024

Y1 - 2024

N2 - We report on the controlled generation and annihilation of defects in photonic platforms using low-energy electron beams. We show how these defects impact propagation losses and EO-stability in LNOI, and how they can be rectified.

AB - We report on the controlled generation and annihilation of defects in photonic platforms using low-energy electron beams. We show how these defects impact propagation losses and EO-stability in LNOI, and how they can be rectified.

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M3 - Paper

AN - SCOPUS:85205103741

T2 - CLEO: Science and Innovations in CLEO 2024, CLEO: S and I 2024 - Part of Conference on Lasers and Electro-Optics

Y2 - 5 May 2024 through 10 May 2024

ER -

Mitigating Electron Beam Induced Defects for Low-Loss and Stable Active Photonic Circuits

Abstract

Conference

ASJC Scopus subject areas

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