Model of superlattice yield stress and hardness enhancements

Xi Chu*, Scott A Barnett

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

14 Scopus citations


A model is presented that explains the yield stress and hardness enhancements that have been observed in superlattice thin films. The predicted strength/hardness enhancement increased with increasing superlattice period, Λ, before reaching a saturation value that depended on interface widths. The results indicate that superlattice strength/hardness depends strongly on interface widths and the difference in shear moduli of the two components for Λ values below the maximum, and on the average shear modulus for larger Λ.

Original languageEnglish (US)
Pages (from-to)291-296
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - Dec 1 1995
EventProceedings of the 1995 MRS Spring Meeting - San Francisco, CA, USA
Duration: Apr 17 1995Apr 21 1995

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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