Abstract
This work presents an innovative approach to modeling the charge transport in dielectric polymers and their nanocomposites by coupling finite element analysis (FEA) with the Monte Carlo (MC) simulation. The stochastic charge hopping among localized states can be well captured by the MC simulation. The altered electric field distribution due to nanofillers can be computed by FEA and contributes to the energy landscape of the localized states. The modeling faithfully reproduces the transient and dispersive nature of the transport as exhibited in many experiment measurements. With nanofillers as deep traps, the modeling also demonstrates the importance of the filler morphology to the effectiveness of charge trapping.
| Original language | English (US) |
|---|---|
| Title of host publication | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 655-658 |
| Number of pages | 4 |
| ISBN (Electronic) | 9781509046546 |
| DOIs | |
| State | Published - Dec 15 2016 |
| Event | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 - Toronto, Canada Duration: Oct 16 2016 → Oct 19 2016 |
Publication series
| Name | Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP |
|---|---|
| Volume | 2016-December |
| ISSN (Print) | 0084-9162 |
Other
| Other | 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena, CEIDP 2016 |
|---|---|
| Country/Territory | Canada |
| City | Toronto |
| Period | 10/16/16 → 10/19/16 |
Funding
This work is supported by U.S. Office of Naval Research under the Grant of N000141310173.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering