Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

L. J. Allen; H. G. Brown; A. J.D. Alfonso; J. Ciston; Y. Lin; L. D. Marks

doi:10.1017/S143192761400213X

Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

L. J. Allen, H. G. Brown, A. J.D. Alfonso, J. Ciston, Y. Lin, L. D. Marks

Materials Science and Engineering

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	82-83
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S143192761400213X
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

ASJC Scopus subject areas

Instrumentation

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10.1017/S143192761400213X

Cite this

@article{e92f57be0571417eaec8b18f42392de5,

title = "Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe",

author = "Allen, {L. J.} and Brown, {H. G.} and Alfonso, {A. J.D.} and J. Ciston and Y. Lin and Marks, {L. D.}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S143192761400213X",

language = "English (US)",

volume = "20",

pages = "82--83",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

AU - Allen, L. J.

AU - Brown, H. G.

AU - Alfonso, A. J.D.

AU - Ciston, J.

AU - Lin, Y.

AU - Marks, L. D.

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927947664&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84927947664&partnerID=8YFLogxK

U2 - 10.1017/S143192761400213X

DO - 10.1017/S143192761400213X

M3 - Conference article

AN - SCOPUS:84927947664

SN - 1431-9276

VL - 20

SP - 82

EP - 83

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Modeling secondary electron imaging at atomic resolution using a focused coherent electron probe

ASJC Scopus subject areas

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