Abstract
Contact x-ray microscopy or microradiography offers a simple-to-use approach to high resolution imaging of wet, thick biological specimens. The paper presents the results of numerical modelling of compact x-ray microscopy using photoresists. Results from this computer modelling will be presented which indicate that considerable care must be used in interpreting contact x-ray microradiographs at sub-100 nm. resolution.
| Original language | English (US) |
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| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Editors | G.W. Bailey, A.J. Garratt-Reed |
| Pages | 62-63 |
| Number of pages | 2 |
| State | Published - Dec 1 1994 |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- General Engineering