INIS
thin films
100%
alloys
100%
substrates
100%
molecular beam epitaxy
100%
epitaxy
100%
cadmium tellurides
100%
range
50%
surfaces
50%
x-ray diffraction
50%
energy
50%
morphology
50%
reduction
50%
reflection
50%
atomic force microscopy
50%
lattice parameters
50%
electron diffraction
50%
diffraction (x-ray)
50%
Physics
Thin Films
100%
Growth
100%
Alloy
100%
Substrates
100%
Molecular Beams
100%
Atomic Force Microscopy
50%
Crystallinity
50%
Molecular Beam Epitaxy
50%
Electron Diffraction
50%
High Energy Electron
50%
Diffraction
50%
Material Science
Thin Films
100%
Alloy
100%
Structural Property
100%
Epitaxy
100%
Rough Surface
50%
Lattice Constant
50%
Surface Morphology
50%
Reflection High-Energy Electron Diffraction
50%
Molecular Beam Epitaxy
50%
Atomic Force Microscopy
50%