Original language | English |
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Pages (from-to) | 5211-5222 |
Journal | Acta Materialia |
Volume | 51 |
State | Published - 2003 |
Molecular dynamics simulation of residual stress in thin films grown by ion-beam deposition process
Sulin Zhang, Harley Johnson, Greg Wagner, Wing-Kam Liu, K. J. Hsia
Research output: Contribution to journal › Article › peer-review