Molecular dynamics simulation of residual stress in thin films grown by ion-beam deposition process

Sulin Zhang, Harley Johnson, Greg Wagner, Wing-Kam Liu, K. J. Hsia

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)5211-5222
JournalActa Materialia
Volume51
StatePublished - 2003

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