TY - JOUR
T1 - Molecular layering in a liquid on a solid substrate
T2 - 6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6)
AU - Yu, C. J.
AU - Richter, A. G.
AU - Datta, A.
AU - Durbin, M. K.
AU - Dutta, P.
N1 - Funding Information:
We are grateful to J. Kmetko for his assistance. This work is supported by the US National Science Foundation (NSF) under Grant No. DMR-9978597, and was performed at Beam Line X-18A (MATRIX) of the National Synchrotron Light Source and at Sector 10 (MRCAT) of the Advanced Photon Source, all of which are supported by the US Department of Energy.
PY - 2000/6
Y1 - 2000/6
N2 - We report the observation of molecular layering in a liquid at the solid-liquid interface, using X-ray reflectivity. The liquid was tetrakis (2-ethylhexoxy) silane (TEHOS), which is nonpolar and insulating, with spherical molecules of about 10 angstroms diameter. We studied both thin (45-90 angstroms) and relatively thick (approximately 5000 angstroms) films, which are prepared by dipping in a dilute solution and by pouring and draining the pure material, respectively. For 45-90 angstroms thick films, three layers of density oscillations are seen near the solid-liquid interface, with a spacing comparable to the molecular size. There is an inverse dependence on the substrate surface roughness. For approximately 5000 angstroms thick films, we observed a diffraction peak with a correlation length of approximately 32 angstroms.
AB - We report the observation of molecular layering in a liquid at the solid-liquid interface, using X-ray reflectivity. The liquid was tetrakis (2-ethylhexoxy) silane (TEHOS), which is nonpolar and insulating, with spherical molecules of about 10 angstroms diameter. We studied both thin (45-90 angstroms) and relatively thick (approximately 5000 angstroms) films, which are prepared by dipping in a dilute solution and by pouring and draining the pure material, respectively. For 45-90 angstroms thick films, three layers of density oscillations are seen near the solid-liquid interface, with a spacing comparable to the molecular size. There is an inverse dependence on the substrate surface roughness. For approximately 5000 angstroms thick films, we observed a diffraction peak with a correlation length of approximately 32 angstroms.
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U2 - 10.1016/S0921-4526(99)01885-2
DO - 10.1016/S0921-4526(99)01885-2
M3 - Conference article
AN - SCOPUS:0033733191
SN - 0921-4526
VL - 283
SP - 27
EP - 31
JO - Physica B: Condensed Matter
JF - Physica B: Condensed Matter
IS - 1-3
Y2 - 12 September 1999 through 17 September 1999
ER -