Molecular layering in a liquid on a solid substrate: An X-ray reflectivity study

C. J. Yu*, A. G. Richter, A. Datta, M. K. Durbin, P. Dutta

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

173 Scopus citations


We report the observation of molecular layering in a liquid at the solid-liquid interface, using X-ray reflectivity. The liquid was tetrakis (2-ethylhexoxy) silane (TEHOS), which is nonpolar and insulating, with spherical molecules of about 10 angstroms diameter. We studied both thin (45-90 angstroms) and relatively thick (approximately 5000 angstroms) films, which are prepared by dipping in a dilute solution and by pouring and draining the pure material, respectively. For 45-90 angstroms thick films, three layers of density oscillations are seen near the solid-liquid interface, with a spacing comparable to the molecular size. There is an inverse dependence on the substrate surface roughness. For approximately 5000 angstroms thick films, we observed a diffraction peak with a correlation length of approximately 32 angstroms.

Original languageEnglish (US)
Pages (from-to)27-31
Number of pages5
JournalPhysica B: Condensed Matter
Issue number1-3
StatePublished - Jun 2000
Event6th International Conference on Surface X-ray and Neutron Scattering (SXNS-6) - Noordwijkerhout, Neth
Duration: Sep 12 1999Sep 17 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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