TY - JOUR
T1 - Molecular self-assembled monolayers and multilayers for organic and unconventional inorganic thin-film transistor applications
AU - DiBenedetto, Sara A.
AU - Facchetti, Antonio
AU - Ratner, Mark A.
AU - Marks, Tobin J.
PY - 2009/4/20
Y1 - 2009/4/20
N2 - Principal goals in organic thin-film transistor (OTFT) gate dielectric research include achieving: (i) low gate leakage currents and good chemical/thermal stability, (ii) minimized interface trap state densities to maximize charge transport efficiency, (iii) compatibility with both p- and n- channel organic semiconductors, (iv) enhanced capacitance to lower OTFT operating voltages and (v) efficient fabrication via solution-phase processing methods. In this Review, we focus on a prominent class of alternative gate dielectric materials: self-assembled monolayers (SAMs) and multilayers (SAMTs) of organic molecules having good insulating properties and large capacitancevalues, requisite properties for addressing these challenges. We first describe the formation and properties of SAMs on various surfaces (metals and oxides), followed by a discussion of fundamental factors governing charge transport through SAMs. The last section focuses on the roles that SAMs and SAMTs play in OTFTs, such as surface treatments, gate dielectrics, and finally as the semiconductor layer in ultra-thin OTFTs.
AB - Principal goals in organic thin-film transistor (OTFT) gate dielectric research include achieving: (i) low gate leakage currents and good chemical/thermal stability, (ii) minimized interface trap state densities to maximize charge transport efficiency, (iii) compatibility with both p- and n- channel organic semiconductors, (iv) enhanced capacitance to lower OTFT operating voltages and (v) efficient fabrication via solution-phase processing methods. In this Review, we focus on a prominent class of alternative gate dielectric materials: self-assembled monolayers (SAMs) and multilayers (SAMTs) of organic molecules having good insulating properties and large capacitancevalues, requisite properties for addressing these challenges. We first describe the formation and properties of SAMs on various surfaces (metals and oxides), followed by a discussion of fundamental factors governing charge transport through SAMs. The last section focuses on the roles that SAMs and SAMTs play in OTFTs, such as surface treatments, gate dielectrics, and finally as the semiconductor layer in ultra-thin OTFTs.
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U2 - 10.1002/adma.200803267
DO - 10.1002/adma.200803267
M3 - Review article
AN - SCOPUS:66149121025
SN - 0935-9648
VL - 21
SP - 1407
EP - 1433
JO - Advanced Materials
JF - Advanced Materials
IS - 14-15
ER -