Momentum-resolved low-loss electron energy loss spectroscopy in oxide superconductor

Y. Y. Wang*, S. C. Cheng, Vinayak P Dravid

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

Abstract

Electron energy loss spectroscopy offers several advantages over other optical techniques in terms of dielectric functions, momentum transfer giving rise to optical forbidden transitions, and in determining the localized nature of excitations. A cold field emission gun (cFEG) electron microscopy (TEM) equipped with a parallel electron energy loss spectrometer (EELS) provides a reasonable energy resolution, a small beam probe and a high counting rate, which eases conditions of sample preparation and makes certain EELS measurements more feasible to do. The electron energy loss spectra of high temperature superconducting materials by using cFEG TEM EELS.

Original languageEnglish (US)
Pages988-989
Number of pages2
StatePublished - Dec 1 1994
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

ASJC Scopus subject areas

  • Engineering(all)

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