Abstract
Electron energy loss spectroscopy offers several advantages over other optical techniques in terms of dielectric functions, momentum transfer giving rise to optical forbidden transitions, and in determining the localized nature of excitations. A cold field emission gun (cFEG) electron microscopy (TEM) equipped with a parallel electron energy loss spectrometer (EELS) provides a reasonable energy resolution, a small beam probe and a high counting rate, which eases conditions of sample preparation and makes certain EELS measurements more feasible to do. The electron energy loss spectra of high temperature superconducting materials by using cFEG TEM EELS.
| Original language | English (US) |
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| Pages | 988-989 |
| Number of pages | 2 |
| State | Published - 1994 |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
| Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
|---|---|
| City | New Orleans, LA, USA |
| Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- Engineering(all)