Abstract
Perfluoropentacene (PFP), an n-type organic semiconductor, is deposited at monolayer and bilayer coverages on Cu(111). Scanning tunneling microscopy at various bias voltages is used to investigate the geometric and electronic structures of the layer. The appearances of the first layer and second layer differ, likely due to perturbation of the first layer electronic structure by the substrate. This has been previously observed for pentacene (Pn), the isostructural p-type organic semiconductor. The PFP film has a unit cell of (4, −3,3 4) relative to the substrate, which is larger than that of Pn/Cu(111), representing a half-integer increment in each direction.
Original language | English (US) |
---|---|
Pages (from-to) | 653-658 |
Number of pages | 6 |
Journal | Journal of Physical Chemistry C |
Volume | 124 |
Issue number | 1 |
DOIs | |
State | Published - Jan 9 2020 |
Funding
Use of the Center for Nanoscale Materials, an Office of Science user facility, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. Primary support for this work was provided by the Department of Energy Office of Basic Energy Sciences (SISGR Grant No. DE-FG02-09ER16109). This work was also supported by Royal Society Research Grant RG130038.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Energy
- Physical and Theoretical Chemistry
- Surfaces, Coatings and Films