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Morphological stability of alloy thin films
J. E. Guyer
*
,
P. W. Voorhees
*
Corresponding author for this work
Materials Science and Engineering
Research output
:
Contribution to journal
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Article
›
peer-review
154
Scopus citations
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Keyphrases
Morphological Stability
100%
Alloy Thin Films
100%
Compressive Strain
50%
Compositional Inhomogeneity
50%
Lattice Mismatch
50%
Misfit Strain
50%
Film Surface
50%
Morphological Instability
50%
Dislocation-free
50%
Linear Stability
50%
Deposition Flux
50%
Misfit Stress
50%
Engineering
Thin Films
100%
Film Surface
33%
Experimental Work
33%
Morphological Instability
33%
Tensiles
33%
Growing Film
33%
Compressive Strain
33%
Generated Stress
33%
Theoretical Work
33%
Linearized Stability
33%
Deposition Flux
33%
Lattice Mismatch
33%
Material Science
Thin Films
100%
Morphology
100%
Film
66%
Film Growth
66%
Lattice Mismatch
33%
Surface (Surface Science)
33%