Multilayer coatings for focussing hard X-ray telescopes

A. Ivan*, R. Bruni, K. Byun, J. Everett, P. Gorenstein, S. Romaine

*Corresponding author for this work

Research output: Contribution to journalConference article

Abstract

Several multilayer test coatings for hard X-ray telescopes were fabricated using DC magnetron sputtering. The process parameters were selected from a series of trials of single layer depositions. The samples were characterized using X-ray specular reflectivity scans, AFM, and cross-sectional TEM. Additional measurements (stylus profilometry, RBS, and Auger analysis) were used in the optimization of the deposition rate and of the thin film properties (density, composition, surface/interface microroughness). The X-ray reflectivity scans showed that the combinations of reflector and spacer materials tested so far (W/Si and W/C) are suited for graded d-spacing multilayer coatings that present a constant reflectivity bandpass up to 70 keV.

Original languageEnglish (US)
Pages (from-to)297-302
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume551
StatePublished - Dec 1 1999
EventThe 1998 MRS Spring Meeting - Symposium on 'Materials in Space-Science, Technology and Exploration' - Boston, MA, USA
Duration: Nov 29 1998Dec 2 1998

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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    Ivan, A., Bruni, R., Byun, K., Everett, J., Gorenstein, P., & Romaine, S. (1999). Multilayer coatings for focussing hard X-ray telescopes. Materials Research Society Symposium - Proceedings, 551, 297-302.