Multimodal imaging of nanostructures with FEG SEM

A. Muto*, D. B. Buchholz, R. P.H. Chang, V. P. Dravid

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)686-687
Number of pages2
JournalMicroscopy and Microanalysis
Volume14
Issue numberSUPPL. 2
DOIs
StatePublished - Aug 1 2008

ASJC Scopus subject areas

  • Instrumentation

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