Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor

Y. Y. Wang; H. Zhang; V. P. Dravid; H. Zhang; L. D. Marks; P. Han; D. A. Payne

Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor

Y. Y. Wang^*, H. Zhang, V. P. Dravid, H. Zhang, L. D. Marks, P. Han, D. A. Payne

^*Corresponding author for this work

Materials Science and Engineering

Research output: Contribution to conference › Paper › peer-review

Abstract

The planar defects in a high pressure synthesized infinite-layer superconductor were investigated as a function of the material's superconducting properties. Nanometer probe x-ray microanalysis, high resolution electron microscopy and image simulation were used to determine the chemical composition and atomic structure of the defects. An atomic structure model was also constructed. The measured and computed results are presented.

Original language	English (US)
Pages	728-729
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Other

Other	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	7/31/94 → 8/5/94

ASJC Scopus subject areas

Engineering(all)

Cite this

@conference{f3f7ebab3aea43b4a27f42a0a36d51b3,

title = "Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor",

abstract = "The planar defects in a high pressure synthesized infinite-layer superconductor were investigated as a function of the material's superconducting properties. Nanometer probe x-ray microanalysis, high resolution electron microscopy and image simulation were used to determine the chemical composition and atomic structure of the defects. An atomic structure model was also constructed. The measured and computed results are presented.",

author = "Wang, {Y. Y.} and H. Zhang and Dravid, {V. P.} and H. Zhang and Marks, {L. D.} and P. Han and Payne, {D. A.}",

year = "1994",

language = "English (US)",

pages = "728--729",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor. / Wang, Y. Y.; Zhang, H.; Dravid, V. P.; Zhang, H.; Marks, L. D.; Han, P.; Payne, D. A.

1994. 728-729 Paper presented at Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor

AU - Wang, Y. Y.

AU - Zhang, H.

AU - Dravid, V. P.

AU - Zhang, H.

AU - Marks, L. D.

AU - Han, P.

AU - Payne, D. A.

PY - 1994

Y1 - 1994

N2 - The planar defects in a high pressure synthesized infinite-layer superconductor were investigated as a function of the material's superconducting properties. Nanometer probe x-ray microanalysis, high resolution electron microscopy and image simulation were used to determine the chemical composition and atomic structure of the defects. An atomic structure model was also constructed. The measured and computed results are presented.

AB - The planar defects in a high pressure synthesized infinite-layer superconductor were investigated as a function of the material's superconducting properties. Nanometer probe x-ray microanalysis, high resolution electron microscopy and image simulation were used to determine the chemical composition and atomic structure of the defects. An atomic structure model was also constructed. The measured and computed results are presented.

UR - http://www.scopus.com/inward/record.url?scp=0028748005&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0028748005&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0028748005

SP - 728

EP - 729

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor

Abstract

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