Abstract
The planar defects in a high pressure synthesized infinite-layer superconductor were investigated as a function of the material's superconducting properties. Nanometer probe x-ray microanalysis, high resolution electron microscopy and image simulation were used to determine the chemical composition and atomic structure of the defects. An atomic structure model was also constructed. The measured and computed results are presented.
Original language | English (US) |
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Pages | 728-729 |
Number of pages | 2 |
State | Published - 1994 |
Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Other
Other | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
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City | New Orleans, LA, USA |
Period | 7/31/94 → 8/5/94 |
ASJC Scopus subject areas
- Engineering(all)