Nano-probe x-ray analysis and high-resolution imaging of planar defects in high-pressure synthesized infinite-layer superconductor

Y. Y. Wang*, H. Zhang, V. P. Dravid, H. Zhang, L. D. Marks, P. Han, D. A. Payne

*Corresponding author for this work

Research output: Contribution to conferencePaperpeer-review

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Engineering & Materials Science