Keyphrases
Photoacoustic Microscopy
100%
Young's Modulus
100%
Nanomechanical Properties
100%
Tungsten Thin Film
100%
Property Evaluation
100%
Frequency-domain Photoacoustics
100%
Scanning Electron Microscopy
50%
X Ray Diffraction
50%
Finite Element Model
50%
Energy Dispersive X-ray Spectroscopy
50%
Modulated Laser
50%
Tungsten
50%
X-ray Reflectivity
50%
Surface Acoustic Wave
50%
Macroscopic Properties
50%
Microcantilever
50%
Nanoindenter
50%
Diffraction Ray
50%
Velocity Dispersion
50%
Relative Error
50%
Direct Current Magnetron Sputtering
50%
Laser Ultrasonic
50%
W Phase
50%
Intensity-modulated
50%
W Film
50%
Resonance Testing
50%
Engineering
Frequency Domain
100%
Young's Modulus
100%
Thin Films
100%
Surface Acoustic Wave
50%
Ray Diffraction
50%
Microcantilevers
50%
Macroscopic Property
50%
Energy Engineering
50%
Finite Element Modeling
50%
Ultrasonics
50%
Relative Error
50%
Magnetron
50%
Reflectance
50%
Direct Current
50%
Material Science
Young's Modulus
100%
Tungsten
100%
Film
100%
Thin Films
100%
Ultrasonic Testing
50%
Magnetron Sputtering
50%
Reflectivity
50%
Scanning Electron Microscopy
50%
X-Ray Diffraction
50%
Surface (Surface Science)
50%
Energy-Dispersive X-Ray Spectroscopy
50%
Finite Element Modeling
50%
Physics
Thin Films
100%
X Ray Spectroscopy
50%
Ultrasonics
50%
X-Ray Diffraction
50%
Finite Element Modeling
50%
Young's Modulus
50%
Acoustic Wave
50%
Scanning Electron Microscopy
50%
Magnetron Sputtering
50%
Young's Modulus
50%
Reflectance
50%