INIS
evaluation
100%
lasers
100%
microscopy
100%
thin films
100%
films
100%
tungsten
100%
young modulus
100%
scanning electron microscopy
50%
surfaces
50%
x radiation
50%
x-ray diffraction
50%
hardness
50%
sputtering
50%
energy
50%
reduction
50%
errors
50%
curves
50%
velocity
50%
resonance
50%
dispersions
50%
finite element method
50%
x-ray spectroscopy
50%
sound waves
50%
direct current
50%
ultrasonics
50%
reflectivity
50%
Material Science
Thin Films
100%
Young's Modulus
100%
Microscopy
100%
Tungsten
100%
Film
100%
Laser
100%
Ultrasonic Testing
50%
Magnetron Sputtering
50%
Reflectivity
50%
Scanning Electron Microscopy
50%
Surface
50%
X-Ray Diffraction
50%
Energy-Dispersive X-Ray Spectroscopy
50%
Velocity
50%
Finite Element Modeling
50%
Hardness
50%
Physics
Thin Films
100%
Microscopy
100%
Tungsten
100%
Domains
100%
Frequencies
100%
Evaluation
100%
Modulus of Elasticity
66%
Laser
66%
X Ray
33%
Scanning Electron Microscopy
33%
Acoustic Wave
33%
X Ray Spectroscopy
33%
X Ray Diffraction
33%
Magnetron Sputtering
33%
Ultrasonics
33%
Estimates
33%
Speed
33%
Ratios
33%
Chemistry
Tungsten
100%
Optical Microscopy
100%
Liquid Film
100%
Young Modulus
50%
Velocity
25%
Reflectivity
25%
Scanning Electron Microscopy
25%
X-Ray Diffraction
25%
Energy Dispersive X-Ray Spectroscopy
25%
Magnetron Sputtering
25%
Molar Property
25%
Surface Acoustic Wave
25%
Procedure
25%
X-Ray
25%
Error
25%
Hardness
25%