Nanometer scale alignment of block-copolymer domains by means of a scanning probe tip

Jonathan R. Felts, M. Serdar Onses, John A. Rogers, William P. King*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Scopus citations

Abstract

Alignment of perpendicularly oriented lamellar block copolymer domains using an AFM tip is demonstrated. The AFM tip orients the domains through local shearing, resulting in domain alignment parallel to tip travel. AFM tips can also deposit block copolymer nanostructures on heated substrates with a variety of experimentally observed domain alignments.

Original languageEnglish (US)
Pages (from-to)2999-3002
Number of pages4
JournalAdvanced Materials
Volume26
Issue number19
DOIs
StatePublished - May 21 2014

Funding

Keywords

  • block-copolymer lithography
  • shear alignment
  • tip-based nanofabrication

ASJC Scopus subject areas

  • Mechanics of Materials
  • Mechanical Engineering
  • General Materials Science

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